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Agilent Technologies, Inc.
Agilent Technologies, Inc. 29 SATA PHY, TSG & OOB Test MOI v.1.1 Revision 1.4
Test TSG-07 - Gen1 (1.5Gbps) TJ at Connector, Clock to Data, Fbaud/10
(Obsolete)
Note: This test is no longer required. It has been left here only for historical reference.
Purpose: Data-to-Data jitter is a measure of variance in the zero crossing times of edges at a fixed time
(tn) equal to an integer number of Unit intervals (n) after triggering on data edges (t0). Since t0 is triggered
from the serial signal rather than a Reference Clock the resulting measurements do represent a
combination of the jitter at t0 and tn.
References:
[1] SATA Interoperability Program Unified Test Document, 2.15.7 TJ at Connector, Clock to Data,
Fbaud/10
Resource Requirements:
Same as for TSG-01.
Last Template Modification: May 7, 2006 (Version 1.02)
Discussion:
This measurement is no longer defined in Serial ATA Revision 3.0 and later.
Test TSG-08 - Gen1 (1.5Gbps) DJ at Connector, Clock to Data, Fbaud/10
(Obsolete)
Note: This test is no longer required. It has been left here only for historical reference.
Purpose: Data-to-Data jitter is a measure of variance in the zero crossing times of edges at a fixed time
(tn) equal to an integer number of Unit intervals (n) after triggering on data edges (t0). Since t0 is triggered
from the serial signal rather than a Reference Clock the resulting measurements do represent a
combination of the jitter at t0 and tn.
References:
[1] SATA Interoperability Program Unified Test Document, 2.15.8 DJ at Connector, Clock to Data,
Fbaud/10
Resource Requirements:
Same as for TSG-01.
Last Template Modification: May 7, 2006 (Version 1.02)
Discussion:
This measurement is no longer defined in Serial ATA Revision 3.0 and later.
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